The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 16, 2007
Filed:
Jan. 09, 2003
Applicants:
Yoshiaki Yazawa, Nishitokyo, JP;
Hideki Kambara, Hachioji, JP;
Masao Kamahori, Kokubunji, JP;
Kunio Harada, Hachioji, JP;
Kazunori Okano, Shiki, JP;
Inventors:
Yoshiaki Yazawa, Nishitokyo, JP;
Hideki Kambara, Hachioji, JP;
Masao Kamahori, Kokubunji, JP;
Kunio Harada, Hachioji, JP;
Kazunori Okano, Shiki, JP;
Assignee:
Hitachi, Ltd., Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
C12M 1/34 (2006.01);
U.S. Cl.
CPC ...
Abstract
A small sized, cost-effective genetic testing apparatus that provides high sensitivity testing, for performing genetic testing simply and at low cost. An optical sensor array for the apparatus and method for luminometric assay comprises a means that simultaneously selects 2 pixels and detects minute amounts of chemiluminescence by obtaining the differential output of the respective signals.