The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 16, 2007

Filed:

Mar. 24, 2004
Applicants:

Deming Shu, Darien, IL (US);

Andrzej Joachimiak, Bolingbrook, IL (US);

Curt A. Preissner, Rosemont, IL (US);

Daniel Nocher, Elwood, IL (US);

Yufeng Han, Chicago, IL (US);

Juan Barraza, Jr., Los Alamos, NM (US);

Peter Lee, Wheaton, IL (US);

Wah-keat Lee, Oak Park, IL (US);

Zhonghou Cai, Naperville, IL (US);

Stephan Ginell, Naperville, IL (US);

Randy Alkire, Romeoville, IL (US);

Robert G. Schuessler, Downers Grove, IL (US);

Inventors:

Deming Shu, Darien, IL (US);

Andrzej Joachimiak, Bolingbrook, IL (US);

Curt A. Preissner, Rosemont, IL (US);

Daniel Nocher, Elwood, IL (US);

Yufeng Han, Chicago, IL (US);

Juan Barraza, Jr., Los Alamos, NM (US);

Peter Lee, Wheaton, IL (US);

Wah-Keat Lee, Oak Park, IL (US);

Zhonghou Cai, Naperville, IL (US);

Stephan Ginell, Naperville, IL (US);

Randy Alkire, Romeoville, IL (US);

Robert G. Schuessler, Downers Grove, IL (US);

Assignee:

UChicago Argonne LLC, Chicago, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
F25D 25/00 (2006.01); F25B 19/00 (2006.01); H05G 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and robot-based automation system are provided for cryogenic crystal sample mounting, for example, for use for cryogenic crystal sample mounting in the x-ray crystallography station at an x-ray source. The system includes a robot arm carrying a handset. The handset includes a pair of elongated fingers for sample mounting, and each finger carrying a set of strain gauge arrays for providing force sensing. A slim finger design allows a sample mounting process with no interference with the beam stop, cryostreem and x-ray detectors. The handset can detect the contact force intensity and direction; provide a precise gripping action; and feel the results of the gripping. The finger design incorporates a mechanism to maintain the sample temperature well below the cryogenic safety margin for the crystal viability. A Dewar container is provided with an ice control system and liquid nitrogen flow control. A triangular sample magazine maximizes the Dewar space usage. A miniature kinematical mounting sample holder provides near micron positioning repeatability. These capabilities make the robot-arm more powerful, flexible, and reliable.


Find Patent Forward Citations

Loading…