The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 2007
Filed:
Dec. 30, 2004
Alan T. G. Jowett, Redmond, WA (US);
Balaji Santhanam, Bellevue, WA (US);
Ravishankar V. Sathanur, Bellevue, WA (US);
Sivaprasad V. Padisetty, Redmond, WA (US);
Thirumalesh K. Bhat, Sammamish, WA (US);
Alan T. G. Jowett, Redmond, WA (US);
Balaji Santhanam, Bellevue, WA (US);
Ravishankar V. Sathanur, Bellevue, WA (US);
Sivaprasad V. Padisetty, Redmond, WA (US);
Thirumalesh K. Bhat, Sammamish, WA (US);
Microsoft Corporation, Redmond, WA (US);
Abstract
The invention provides a framework for collecting, storing, and analyzing system metrics concerning a computing system or a computer component. A configuration module is provided to configure settings specific to a metric. A data collection module is provided to collect metric data according to the settings in the configuration module and in one or more component specific plug-ins that extend and customize the framework according to specific needs of the component. The data collection module collects metrics at specified time intervals and periodically updates metric data stored in a central metrics storage module. An analysis module is provided to analyze metric data stored in the central metrics storage module online or offline. The analysis module may analyze a metric statistically or graphically, individually or combined with other metrics.