The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 2007
Filed:
Oct. 08, 2002
Tse-wei Wang, Oak Ridge, TN (US);
Ning Xue, Knoxville, TN (US);
John D. Birdwell, Oak Ridge, TN (US);
Mark Rader, Knoxville, TN (US);
John Flaherty, Knoxville, TN (US);
Tse-Wei Wang, Oak Ridge, TN (US);
Ning Xue, Knoxville, TN (US);
John D. Birdwell, Oak Ridge, TN (US);
Mark Rader, Knoxville, TN (US);
John Flaherty, Knoxville, TN (US);
Other;
Abstract
Least Square Deconvolution (LSD) uses quantitative allele peak data derived obtained from a sample containing the DNA of more than one contributor to resolve the best-fit genotype profile of each contributor. The resolution is based on finding the least square fit of the mass ratio coefficients at each locus to come closest to the quantitative allele peak data. Consistent top-ranked mass ratio combinations from each locus can be pooled to form at least one composite DNA profile at a subset of the available loci. The top-ranked DNA profiles can be used to check against the profile of a suspect or be used to search for a matching profile in a DNA database.