The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2007

Filed:

May. 16, 2002
Applicants:

Wataru Ohno, Hachioji, JP;

Masaaki Ueda, Sagamihara, JP;

Masahiko Kinukawa, Sagamihara, JP;

Inventors:

Wataru Ohno, Hachioji, JP;

Masaaki Ueda, Sagamihara, JP;

Masahiko Kinukawa, Sagamihara, JP;

Assignee:

Olympus Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/05 (2006.01);
U.S. Cl.
CPC ...
Abstract

With the beam scanning probe system for surgery, a pointer indicating the observation point of a beam scanning probe is superimposed upon an image of a lesion to be operated on in the head which is obtained via a TV camera or a surgery microscope, and the superimposed image information is registered as such in an image recording device. With the beam scanning probe system for surgery, information of a cytological picture is also registered in the image recording device. With the beam scanning probe system for surgery, the image recording device registers the two image information in a paired fashion. Through this arrangement, the beam scanning probe system for surgery can smoothly locate, for a given cytological picture, a site of a tumor to be treated from which the picture was obtained, which will ease the operation.


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