The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2007

Filed:

Apr. 12, 2002
Applicants:

Hui Jin, Beijing, CN;

LI Zhang, Beijing, CN;

Zhiqiang Chen, Beijing, CN;

Jianping Cheng, Beijing, CN;

Inventors:

Hui Jin, Beijing, CN;

Li Zhang, Beijing, CN;

Zhiqiang Chen, Beijing, CN;

Jianping Cheng, Beijing, CN;

Assignees:

Tsinghua University, Beijing, CN;

Nuctech Company Limited, Beijing, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/48 (2006.01); G06K 9/56 (2006.01);
U.S. Cl.
CPC ...
Abstract

An image segmentational recognition method in industrial radiational imaging, comprising the steps of: pre-processing an original image to climate noises; log-transforming, to obtain a linear attenuation coefficient image; edge detecting; edge tracking, to track the points whose edge values are close to each other to obtain edge segments; edge connecting, to connect edge segments; edge connecting, to connect edge segments whose average edge values are close to each other; edge closing; region filling; and region displaying. In comparison with existing arts, the present invention can separate effectively the overlapped objects in an image, raise the efficiency of image inspection, and find out concealed contraband goods more easily.


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