The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2007

Filed:

Dec. 11, 2001
Applicants:

Noriji Kato, Nakai-machi, JP;

Hirotsugu Kashimura, Nakai-machi, JP;

Hitoshi Ikeda, Nakai-machi, JP;

Inventors:

Noriji Kato, Nakai-machi, JP;

Hirotsugu Kashimura, Nakai-machi, JP;

Hitoshi Ikeda, Nakai-machi, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
Abstract

A pattern recognition method and apparatus decrease the amount of computation for pattern recognition and adapts flexibly to an increase and a change in learning samples. Learning is made beforehand on base vectors in a subspace of each category and a kernel function. Pattern data to be recognized is input, and projection of an input pattern to a nonlinear subspace of each category is decided. Based on the decided projection, a Euclidean distance or an evaluation value related to each category is calculated from the property of the kernel function, and is compared with a threshold value. If a category for which the evaluation value is below the threshold value exists, a category for which the evaluation value is the smallest is output as a recognition result. If there is no category for which the evaluation value is below the threshold value, a teaching signal is input for additional learning.


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