The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 2007
Filed:
Dec. 02, 2002
Matthijs Adriaansz, Eindhoven, NL;
Matthijs Adriaansz, Eindhoven, NL;
Koninklijke Philips Electronics, N.V., Eindhoven, NL;
Abstract
The invention relates to a method to measure the entrance dose of a radiology apparatus of the type comprising an X-ray beam source, and a detector for the X-ray beam after it has passed an object of interest carried on a table placed between the source and the detector, wherein the X-ray beam source is placed above said table and wherein the distance between the X-ray beam source and the object is estimated taking into account the object's morphology, for determining said entrance dose. An attenuation-ratio is calculated depending on energy-levels of the X-ray beam leaving the X-ray beam source and arriving at the detector respectively, and that the object's thickness is calculated depending on said attenuation-ratio, said thickness together with the table-position defining said distance between the X-ray beam source and the object.