The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2007

Filed:

Jul. 19, 2002
Applicant:

Paul Bjorkholm, Newport Beach, CA (US);

Inventor:

Paul Bjorkholm, Newport Beach, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

An X-ray source is disclosed comprising a source of high energy electrons that travel along a longitudinal path. Target material lies along the longitudinal path and X-ray radiation is generated due to impact of the high energy electrons with the target. Shielding material is provided around at least a portion of the target. The shielding material defines a slot extending from the target to an exterior surface of the shielding material, to allow passage of generated radiation. The slot has an axis transverse to the longitudinal path. The axis may be perpendicular longitudinal path. The shielding material may define a plurality of slots having transverse axes. The source of high energy electrons may be a linear accelerator, for example. Scanning systems incorporating such sources are also disclosed. The scanning system comprises a conveying system having a longitudinal axis and the radiation source may be positioned so that the longitudinal path forms an acute angle with respect to the longitudinal axis, to decrease the size of the scanning unit as compared to a unit where the longitudinal axis is perpendicular to the longitudinal path. The longitudinal axis may be parallel to the longitudinal path, to form a more compact scanning system. A plurality of slots may be defined in the shielding material and a corresponding number of conveying systems may be provided to examine a plurality of objects concurrently. Methods of generating radiation and methods of examining objects are also disclosed.


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