The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2007

Filed:

Sep. 10, 2003
Applicant:

Shang-pin Sun, Tai-Nan, TW;

Inventor:

Shang-Pin Sun, Tai-Nan, TW;

Assignee:

Mediatek Inc., Hsin-Chu Hsien, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method used in an optical disc reproducing system for identifying the type of an optical disc, wherein the optical disc reproducing system comprises a pickup; the pickup comprising a first light source and a second light source. The method comprises: (a) measuring a first time needed for the focus of the first light source to move from a plastic layer to a reflection layer of the optical disc; (b) measuring the characteristics of a focus error signal while the focus of the first light source is moving in the reflection layer of the optical disc; (c) measuring the characteristics of the focus error signal while the focus of the second light source is moving in the reflection layer of the optical disc; and (d) identifying the type of the optical disc according to the first time and the results measured in steps (b) and (c).


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