The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2007

Filed:

May. 12, 2003
Applicant:

Ring-ling Chien, San Jose, CA (US);

Inventor:

Ring-Ling Chien, San Jose, CA (US);

Assignee:

Caliper Life Sciences, Inc., Mountain View, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/08 (2006.01); G01N 27/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides novel methods and devices for testing/verifying the configuration of one or more microfluidic elements in a microfluidic device. In particular the methods and devices of the invention are useful in testing for blockages or the presence of air bubbles in microfluidic elements. For example, a method for verifying the proper function of a microfluidic device is disclosed, which device comprises at least first, second and third fluidic openings, which fluidic openings are fluidly coupled to at least first, second and third microscale channel elements, respectively, the method comprising flowing an electrically conductive buffer through the first, second and third microscale channel elements; setting a known applied voltage potential (or current) between the first and second fluidic openings; setting a current in the third microscale channel element to be approximately zero; detecting a resulting voltage at the third fluidic opening; and, comparing the detected voltage at the third fluidic opening with a calculated target voltage expected at the third fluidic opening to determine whether there is a fault or problem (e.g., air bubble) in at least one of the first and second microscale channel elements. The above method can be repeated one or more times for the other fluidic openings in the microfluidic device to determine whether there is a fault in any one or more microscale elements of the device.


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