The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 2007
Filed:
Mar. 29, 2004
Toru Shibutani, Hitachi, JP;
Akihisa Kaihara, Hitachi, JP;
Toru Shibutani, Hitachi, JP;
Akihisa Kaihara, Hitachi, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
An α-ray measuring apparatus is provided for accurately analyzing the energy of a trace of α-rays emitted from a sample in a short time using semiconductor detectors which excel in energy resolution. The α-ray measuring apparatus comprises an α-ray detector including a plurality of semiconductor detectors, an adder for adding output signals from the respective semiconductor detectors, an anticoincidence counter for anticoincidently counting the output signals from the respective semiconductor detectors, and a peak analyzer for analyzing an energy distribution of the α-rays based on an addition of the output signals from the semiconductor detectors which are not anticoincidently counted. Since the output signals from the plurality of semiconductor detectors are added to increase the area of a sample under measurement and also remove background noise, the α-ray measuring apparatus can more accurately analyze the energy of the α-rays while reducing a measuring time.