The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 2007
Filed:
Aug. 20, 2004
Applicants:
Juan Fernandez DE LA Mora, New Haven, CT (US);
Michael J. Labowsky, Wayne, NJ (US);
Jerome J. Schmitt, Iii, Wellington, FL (US);
G. Wayne Neilson, Vista, CA (US);
Inventors:
Juan Fernandez De La Mora, New Haven, CT (US);
Michael J. Labowsky, Wayne, NJ (US);
Jerome J. Schmitt, III, Wellington, FL (US);
G. Wayne Neilson, Vista, CA (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/40 (2006.01); G01N 27/60 (2006.01);
U.S. Cl.
CPC ...
Abstract
A differential mobility analyzer (DMA) for separating charged particles or ions suspended in a gas and a method of using the DMA for separating such particles. The invention includes various means for increasing the resolution of the DMA by stabilizing the laminar flow within the DMA and by allowing unusually large flow velocities.