The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 2007
Filed:
Jul. 12, 2005
Hong Yul Paik, Daejeon, KR;
Hae Jin Choi, Seoul, KR;
Gi Hyuk Choi, Daejeon, KR;
Jong Woo Kim, Daejeon, KR;
Youn Kyu Kim, Daejeon, KR;
Hong Yul Paik, Daejeon, KR;
Hae Jin Choi, Seoul, KR;
Gi Hyuk Choi, Daejeon, KR;
Jong Woo Kim, Daejeon, KR;
Youn Kyu Kim, Daejeon, KR;
Korea Aerospace Research Institute, Daejeon, KR;
Abstract
The mass measurement system includes a linear acceleration motion unit that is a linear motion driving source, a first load cell fastened to the linear acceleration motion unit to measure an inertial force of a sample caused by linearly accelerated motion of the 10 linear acceleration motion unit, a second load cell fastened to the linear acceleration motion unit while being spaced apart from the first load cell by a predetermined distance, the second load cell measuring an inertial force of a standard sample having a known standard mass caused by the linearly accelerated motion of the linear acceleration motion unit, and a main control unit for calculating and outputting mass of the sample through an arithmetic operation based on the inertial forces, measured by the first and second load cells, and the standard mass, and controlling an entire operation of the system.