The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 2007
Filed:
May. 20, 2005
Gregory P. Saguto, St. Charles, MO (US);
Gregory P. Saguto, St. Charles, MO (US);
The Boeing Company, Chicago, IL (US);
Abstract
Systems and methods of measuring residual stress are disclosed. In one embodiment, a method of measuring residual stress in a material under test includes directing radiation onto a stressed material and detecting the resulting diffraction peaks to measure known residual stress of a control specimen, inducing and sensing magnetoelastic interactions onto the control specimen, developing an empirical database of the diffraction and magnetoelastic interaction measurements of the control specimen, inducing and measuring magnetoelastic interactions on a material under test, and correlating the empirical database to the magnetoelastic interaction outputs from the material under test.