The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 2007
Filed:
Jul. 22, 2004
Thomas Moelkner, Stuttgart, DE;
Holger Scholzen, Stuttgart, DE;
Joerg Gebers, Hemmingen, DE;
Ralf Kaiser, Unterbruenden, DE;
Carsten Kaschube, Nuertingen, DE;
Christian Roesser, Grossbottwar-Winzerhausen, DE;
Lothar Baumann, Wernau, DE;
Hans-peter Didra, Kusterdingen-Jettenburg, DE;
Roger Frehoff, Gerlingen, DE;
Markus Fissler, Tamm, DE;
Markus Ledermann, Asperg, DE;
Benjamin Thiel, Stuttgart, DE;
Thomas Moelkner, Stuttgart, DE;
Holger Scholzen, Stuttgart, DE;
Joerg Gebers, Hemmingen, DE;
Ralf Kaiser, Unterbruenden, DE;
Carsten Kaschube, Nuertingen, DE;
Christian Roesser, Grossbottwar-Winzerhausen, DE;
Lothar Baumann, Wernau, DE;
Hans-Peter Didra, Kusterdingen-Jettenburg, DE;
Roger Frehoff, Gerlingen, DE;
Markus Fissler, Tamm, DE;
Markus Ledermann, Asperg, DE;
Benjamin Thiel, Stuttgart, DE;
Robert Bosch GmbH, Stuttgart, DE;
Abstract
A pressure sensor for measuring the pressure in a space acted upon by high pressure. The signals detected by the pressure sensor are supplied to evaluation electronics. A sensor diaphragm is accommodated on the end of the pressure sensor pointing towards the space acted upon by high pressure. The sensor diaphragm takes the form of a steel diaphragm, to whose back side a thin, metallic layer accommodating piezoresistive measuring elements is applied. The thin, metallic layer is contacted by transmission elements and connected to the evaluation electronics.