The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 2007
Filed:
Apr. 29, 2005
Masayoshi Shinohara, Kyoto, JP;
Hiroshi Mizutani, Kyoto, JP;
Masayoshi Shinohara, Kyoto, JP;
Hiroshi Mizutani, Kyoto, JP;
Horiba, Ltd., Kyoto, JP;
Abstract
A highly sensitive particulate matter concentration measuring apparatus for measuring a concentration of particulate matter in a sample gas collected in a collecting region formed on a collecting medium, the collecting region being formed by drawing the sample gas through a cross-sectional area of the collecting medium, the collecting medium is a filter tape that includes a porous film made of a fluorine resin and a reinforcing layer provided on the porous film, the particulate matter concentration is measured using a beta-ray absorbing method while removing the error influences of naturally occurring beta radiation, and includes an additional impact type sampler or cyclone type sampler for filtering the sample gas prior to collecting the particulate matter in the collecting region.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile