The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2007

Filed:

Jun. 05, 2000
Applicants:

Ahmed Saifuddin, San Diego, CA (US);

Joseph P. Odenwalder, Del Mar, CA (US);

Yu-cheun Jou, San Diego, CA (US);

Edward G. Tiedemann, Jr., San Diego, CA (US);

Inventors:

Ahmed Saifuddin, San Diego, CA (US);

Joseph P. Odenwalder, Del Mar, CA (US);

Yu-Cheun Jou, San Diego, CA (US);

Edward G. Tiedemann, Jr., San Diego, CA (US);

Assignee:

Qualcomm Incorporated, San Diego, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and an apparatus for recovery of particular bits in a frame are disclosed. An origination station forms a frame structure with groups of information bits of different importance. All the information bits are then protected by an outer quality metric. Additionally, the groups of more important information bits are further protected by an inner quality metric; each group having a corresponding quality metric. The frame is then transmitted to a destination station. The destination station decodes the received frame and decides, first in accordance with the outer quality metric, whether the frame has been correctly received, or whether the frame is erased. If the frame has been declared erased, the destination station attempts to recover the groups of more important information bits in accordance with the corresponding inner quality metrics.


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