The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 02, 2007
Filed:
Aug. 20, 2002
Lothar Wenzel, Round Rock, TX (US);
Ram Rajagopal, Austin, TX (US);
Dinesh Nair, Austin, TX (US);
National Instruments Corporation, Austin, TX (US);
Abstract
System and method for determining the presence of an object of interest from a template image in an acquired target image, despite of or using various types of affine transformations of the object of interest in the target image. A template image discrete curve is determined from the template image corresponding to the object of interest, and a template curve canonical transform calculated based on the curve. The canonical transform is applied to the template curve to generate a mapped template curve. The target image is received, a target image discrete curve determined, and a target curve canonical transform computed based on the target curve canonical transform. The target canonical transform is applied to the target curve to generate a mapped target curve. Geometric pattern matching is performed using the mapped template and target image discrete curves to generate pattern matching results, and the pattern matching results are output.