The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 02, 2007
Filed:
Aug. 18, 2005
Applicants:
Masahiro Sakakura, Hachiouji, JP;
Yasushi Fujimoto, Hino, JP;
Inventors:
Masahiro Sakakura, Hachiouji, JP;
Yasushi Fujimoto, Hino, JP;
Assignee:
Olympus Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
An objective lens system for microscope which comprises first and second lens units or first through fourth lens units, and in which the second or third lens unit has a function to correct chromatic aberration within a range from a visible region to a near infrared region and aberrations are favorably corrected within the range from the visible region to the near infrared region.
Sakakura, Masahiro. (2007). Objective lens system for microscope (U.S. Patent No. 7158310). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7158310
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile