The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 02, 2007
Filed:
Dec. 21, 2004
Michael Lee Alles, Nashville, TN (US);
Norman H. Tolk, Brentwood, TN (US);
Bongim Jun, Nashville, TN (US);
Robert Pasternak, Nashville, TN (US);
Ron Schrimpf, Franklin, TN (US);
Sorin Cristoloveanu, Seyssinet-Pariset, FR;
Michael Lee Alles, Nashville, TN (US);
Norman H. Tolk, Brentwood, TN (US);
Bongim Jun, Nashville, TN (US);
Robert Pasternak, Nashville, TN (US);
Ron Schrimpf, Franklin, TN (US);
Sorin Cristoloveanu, Seyssinet-Pariset, FR;
Vanderbilt University, Nashville, TN (US);
Abstract
A method for non-invasively probing at least one interface property in a layered structure having at least one interface. In one embodiment, the method includes the steps of exposing the layered structure to an incident photon beam at an incident angle to produce a reflection beam, measuring intensities of the second harmonic generation signals from the reflection beam, and identifying an initial second harmonic generation intensity and a time evolution of second harmonic generation intensity from the measured second harmonic generation intensities so as to determine the at least one interface property of the layered structure.