The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2007

Filed:

Jun. 17, 2004
Applicants:

Raymond J. Slesinski, Arnold, MO (US);

Richard J. Steckel, Washington, MO (US);

Curtis M. Ashford, St. Peters, MO (US);

Jeffery J. Luner, Collinsville, IL (US);

Inventors:

Raymond J. Slesinski, Arnold, MO (US);

Richard J. Steckel, Washington, MO (US);

Curtis M. Ashford, St. Peters, MO (US);

Jeffery J. Luner, Collinsville, IL (US);

Assignee:

The Boeing Company, Chicago, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system for certifying laser projection beam accuracy includes a certification fixture having a test pattern and a color background. The certification fixture is configured so that any portion of the laser projection beam reflected from the color background is reflected with a color contrasting to that of the laser beam or of the test pattern. Contrast can be further enhanced by making the pattern of a material that absorbs the laser beam color. Failure of the test is indicated by the presence of any of the laser beam light reflecting from the background. Passage of the test is indicated by the laser beam striking only the test pattern. A functional test pattern tests for both laser beam width and positioning accuracy. A method is provided to use a calibration test pattern to test laser beam width and length projection accuracy independently of one another.


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