The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 02, 2007
Filed:
May. 16, 2003
Shin-ichiro Taguchi, Tokyo, JP;
Masaaki Matsushima, Tokyo, JP;
Shin-ichiro Taguchi, Tokyo, JP;
Masaaki Matsushima, Tokyo, JP;
Hoya Corporation, Tokyo, JP;
Abstract
A dioptric power distribution measuring device () measures the dioptric power distribution of a target lens. A computer () constructs a design lens spatial model in a virtual space, and calculates the dioptric power distribution of the design lens spatial model by performing simulation processing for incident/exit light for only the same point in the design lens spatial model as a measurement point on the target lens. The computer then compares the calculated dioptric power distribution with the dioptric power distribution of the target lens which is measured by the dioptric power distribution measuring device ().
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile