The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2007

Filed:

Jun. 28, 2004
Applicants:

Henry Shih-ming Chao, Danville, CA (US);

Colin Geoffrey Trevor, Pleasanton, CA (US);

Paul Edward Mooney, Pleasanton, CA (US);

Bernd Kraus, Munich, DE;

Inventors:

Henry Shih-Ming Chao, Danville, CA (US);

Colin Geoffrey Trevor, Pleasanton, CA (US);

Paul Edward Mooney, Pleasanton, CA (US);

Bernd Kraus, Munich, DE;

Assignee:

Ropintassco Holdings, L.P., Deluth, GA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01K 1/08 (2006.01); H01J 3/14 (2006.01); H01J 3/26 (2006.01); G01N 23/00 (2006.01); G21K 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A charged particle device is provided comprising a charged particle source configured to direct charged particles in the direction of a specimen under examination and an imaging device configured to convert charged particles to an image representing the specimen. The imaging device comprises a detector defining a pixel array. The detector is configured to generate electric charges for individual pixels of the pixel array such that the electric charges collectively define the image. The imaging device is configured such that a portion of the pixel array can be transitioned between a partially masked state and a substantially unmasked state.


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