The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2007

Filed:

May. 27, 2003
Applicants:

Yoshiaki Yazawa, Nishitokyo, JP;

Masao Kamahori, Kokubunji, JP;

Hideki Kambara, Hachiouji, JP;

Mitsuo Usami, Tachikawa, JP;

Ken Takei, Kawasaki, JP;

Inventors:

Yoshiaki Yazawa, Nishitokyo, JP;

Masao Kamahori, Kokubunji, JP;

Hideki Kambara, Hachiouji, JP;

Mitsuo Usami, Tachikawa, JP;

Ken Takei, Kawasaki, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 15/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method are provided for detecting biological and chemical material. To measure biological materials such as genes easily at low costs, the device for implementing a small-sized, high sensitive, economical measurement apparatus is provided. Probes appropriate for target biological materials are fixed on a chip, on which a sensor, identification number, and radio communication function are implemented, the captured targets are detected by the sensors, and the result of sensing are transferred to an external control unit by the radio communication function. The small-sized, high sensitivity measurement apparatus for detecting biological and chemical materials such as genes and measuring physical and chemical amounts such as temperature, pressure, pH, and the like can be implemented.


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