The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2007

Filed:

Aug. 28, 2001
Applicants:

Miquel Boleda, Barcelona, ES;

Michel Encrenaz, Barcelona, ES;

James L Mccullough, San Diego, CA (US);

Jorge Castano, Barcelona, ES;

Inventors:

Miquel Boleda, Barcelona, ES;

Michel Encrenaz, Barcelona, ES;

James L McCullough, San Diego, CA (US);

Jorge Castano, Barcelona, ES;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 2/045 (2006.01);
U.S. Cl.
CPC ...
Abstract

PPS variation along a scan axis is found by shining a light beam from pen carriage to print-medium position and back to detector, and applying a pathlength/intensity correlation. Sensing is done while scanning, to find relative PPS profile along the track. With no medium in place this measures mechanical imperfections—and can be corrected by later deducting thickness of a medium. If medium is present, adjustment is omitted. For absolute values a plural-lamp sensor is calibrated for each lamp, at the PPS design point. Pagewide/webwide variants are included.


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