The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 26, 2006
Filed:
Nov. 24, 2004
Applicant:
Kensuke Shinohara, Kawasaki, JP;
Inventor:
Kensuke Shinohara, Kawasaki, JP;
Assignee:
Fujitsu Limited, Kawasaki, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A process variation detector includes a pulse-signal generating unit that generates a pulse signal having a pulse width corresponding to a characteristic of a process variation in an integrated circuit based on a clock signal; and an output unit that generates a predetermined value, when the pulse signal indicates a specific process variation, by using a transistor of which a channel width and a gate length are set to an unbalanced state, and outputs the predetermined value.
Shinohara, Kensuke. (2006). Process variation detector and process variation detecting method (U.S. Patent No. 7155360). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7155360
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