The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 26, 2006

Filed:

May. 10, 2002
Applicants:

David S. Levy, Freehold, NJ (US);

Peter H. Mitev, Eatontown, NJ (US);

Inventors:

David S. Levy, Freehold, NJ (US);

Peter H. Mitev, Eatontown, NJ (US);

Assignee:

Lucent Technologies Inc., Murray Hill, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

Method and apparatus for fault localization in an optical network using time trend correlation of end node performance parameters and intermediate node performance parameters, such as QoS and quasi-Q factors, respectively. The method and apparatus are bit-rate and protocol independent, enabling testing for each channel of a diverse dense wavelength division multiplexed traffic system using a single set of hardware.


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Levy, David. (2006). Method and apparatus for locating faults in an optical network (U.S. Patent No. 7155123). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7155123

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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