The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 26, 2006

Filed:

Mar. 08, 2005
Applicants:

Jun-sik Kim, Seoul, KR;

In-so Kweon, Daejeon, KR;

Inventors:

Jun-Sik Kim, Seoul, KR;

In-So Kweon, Daejeon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to a camera calibration system and method thereof which is capable of easily performing camera calibration using a concentric circle pattern. According to the invention, a method of calibrating a camera calibrates the intrinsic parameters of the camera required to measure geometric information of an object using projection invariable characteristics of concentric circles. The method includes the steps of taking images of the calibration pattern consisting of two or more concentric circles located in the same plane and having different radius at different angles to obtain projected images calculating the central point of the projected images using a given algorithm, and calculating the principal point and focal point of camera using a nonlinear minimization algorithm based on the central point thus obtained.


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