The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 26, 2006
Filed:
Aug. 06, 2003
Wolfgang Holzapfel, Obing, DE;
Michael Hermann, Tacherting, DE;
Walter Huber, Traunstein, DE;
Völker Hofer, Traunreut, DE;
Ulrich Benner, Trostberg, DE;
Karsten Sändig, Palling, DE;
Wolfgang Holzapfel, Obing, DE;
Michael Hermann, Tacherting, DE;
Walter Huber, Traunstein, DE;
Völker Hofer, Traunreut, DE;
Ulrich Benner, Trostberg, DE;
Karsten Sändig, Palling, DE;
Johannes Heidenhain GmbH, Traunreut, DE;
Abstract
An interferential position measuring arrangement including a light source, which emits a beam of rays and an optical element, which converts the beam of rays emitted by the light source into an incoming beam of rays. A scale grating which splits the incoming beam of rays into a first partial beam of rays and a second partial beam of rays. A first scanning grating that causes splitting of the first partial beam of rays and a second scanning grating that causes splitting of the second partial beam of rays, wherein a periodically modulated interferential fringe pattern with definite spatial interferential fringe pattern period results in a detection plane. A detection arrangement which causes splitting of light entering through the detection arrangement into at least three different spatial directions and optoelectronic detector elements arranged in the at least three spatial directions for detecting phase-shifted scanning signal.