The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 26, 2006
Filed:
Sep. 19, 2002
Bruce W. Adams, Cloverdale, CA;
Peter R. H. Mcconnell, Vancouver, CA;
Bruce W. Adams, Cloverdale, CA;
Peter R. H. McConnell, Vancouver, CA;
Joule Microsystems Canada, Inc., Burnaby, CA;
Abstract
An optical system for performing a spectral analysis of test samples is provided. The optical system comprises a photonic energy source, an optical emission processing system, a received light optical processing system, an optical detector and a digital signal processing system. The optical emission processing system transmits one or more illumination wavelengths to a test sample. The received light optical processing system collects and isolates one or more wavelengths received from the test sample and transmits them to an optical detector. The optical detector converts the isolated one or more wavelengths of received electromagnetic radiation into an electrical signal which is transmitted to the digital signal processing system. The digital signal processing system performs matched filtering of the electrical signal received from the optical detector and additionally controls the functionality of the photonic energy source, the optical emission processing system and the received light optical processing system.