The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 26, 2006
Filed:
Feb. 11, 2003
Applicants:
Yuji Itoh, Ibaraki, JP;
Ngai-man Cheung, Los Angeles, CA (US);
Inventors:
Yuji Itoh, Ibaraki, JP;
Ngai-Man Cheung, Los Angeles, CA (US);
Assignee:
Texas Instruments Incorporated, Dallas, TX (US);
Primary Examiner:
Int. Cl.
CPC ...
H04N 11/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
This invention corrects chrominance misalignment that occurs during chrominance down-sampling and up-sampling. The invention extracts a binary index from the corresponding luminance signal. The binary index enables generation of a filter window. On down-sampling the filter window is applied to a block of source chrominance pixels which are filtered or not based upon the binary index. On up-sampling the binary index of the filter window for the target chrominance pixels determines which are filtered or not.