The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7154291 B1

PDF
Full Text
Expired
Date of Patent:
Dec. 26, 2006

Filed:

Aug. 24, 2004
Applicant:

Steven Richard Turner, Carmel, IN (US);

Inventor:

Steven Richard Turner, Carmel, IN (US);

Assignee:

Delphi Technologies, Inc., Troy, MI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus for measuring current, and particularly bi-directional current, in a field-effect transistor (FET) using drain-to-source voltage measurements. The drain-to-source voltage of the FET is measured and amplified. This signal is then compensated for variations in the temperature of the FET, which affects the impedance of the FET when it is switched on. The output is a signal representative of the direction of the flow of current through the field-effect transistor and the level of the current through the field-effect transistor. Preferably, the measurement only occurs when the FET is switched on.


Find Patent Forward Citations

Turner, Steven. (2006). Measuring bi-directional current through a field-effect transistor by virtue of drain-to-source voltage measurement (U.S. Patent No. 7154291). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7154291

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