The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 26, 2006
Filed:
Mar. 19, 2003
Yoshio Sunaoka, Tokyo, JP;
Shinichi Ohashi, Tokyo, JP;
Toshio Morita, Tokyo, JP;
Masashi Fujita, Tokyo, JP;
Yoshio Sunaoka, Tokyo, JP;
Shinichi Ohashi, Tokyo, JP;
Toshio Morita, Tokyo, JP;
Masashi Fujita, Tokyo, JP;
Organo Corporation, Tokyo, JP;
Abstract
A high-sensitivity measuring instrument comprising at least two sensors for detecting the same characteristics by touching a substance being measured with a specified time difference, wherein the between detection signals taken out simultaneously from respective sensors is determined, the difference between characteristic values upon elapsing the specified time difference is determined from the difference between detection signals, a reference time of measurement and a reference characteristic value at that time are preset, a time axis having a time pitch of a specified time difference is set, and a measurement value is obtained at a point in time elapsing an arbitrary time pitch from the reference time. Objective measurement characteristics can be detected by the measuring instrument not in the form of difference or variation but as an absolute value with high accuracy and sensitivity.