The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 26, 2006

Filed:

Nov. 09, 2005
Applicants:

E. Mark Haacke, Grosse Pointe Farms, MI (US);

Yingbiao Xu, Dunlap, IL (US);

Inventors:

E. Mark Haacke, Grosse Pointe Farms, MI (US);

Yingbiao Xu, Dunlap, IL (US);

Assignee:

MR Innovations, Inc., Detroit, MI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Segmented echo planar nuclear magnetic resonance imaging is performed using an iterative correction method that corrects or suppresses geometric distortion in the image domain caused by off-resonance phase discontinuities in the phase encoding direction. The iterative correction method can be performed in a single scan by providing extra gradients in the pulse sequence to generate an extra transverse magnetization echo from the pulse. Additionally, the iterative correction method can be performed using a separate non-segmented double-echo scan in combination with data obtained using a conventional segmented echo planar imaging pulse sequence.


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