The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 26, 2006

Filed:

Oct. 19, 2004
Applicant:

Chung-kai Chow, Austin, TX (US);

Inventor:

Chung-Kai Chow, Austin, TX (US);

Assignee:

Semtech Corporation, Camarillo, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A precision measurement unit (PMU) includes a force amplifier selectively providing either a forcing voltage or a forcing current to a device under test via an output force terminal. A low limit voltage clamp and a high limit voltage clamp are operatively coupled to the output force terminal. The low and high limit voltage clamps are each responsive to user programming to define respective low and high voltage limits at the output force terminal. Upon detection of a reversal of said user programming, the operation of the low and high limit voltage clamps is disabled. More particularly, a comparator is adapted to compare the low and high voltage limits and provide a corresponding disabling signal if the high voltage limit is lower than the low voltage limit.


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