The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 26, 2006

Filed:

Jul. 06, 2005
Applicant:

Mitsuhiro Hara, Tokyo, JP;

Inventor:

Mitsuhiro Hara, Tokyo, JP;

Assignee:

Olympus Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 27/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

Compact design is achieved to minimize blocking of the field of view of a stereomicroscope apparatus. Furthermore, astigmatism is decreased to produce a high-quality image. An optical-scanning microscope apparatus includes a light source, a light-transmitting member for transmitting light from the light source, an apparatus main body for illuminating a subject with the light transmitted by the light-transmitting member, and a photodetector for detecting return light returning from the subject via the apparatus main body and the light-transmitting member. The apparatus main body includes a collimating optical system for converting the light transmitted by the light-transmitting member into collimated light, a scanning mirror for deflecting the collimated light emitted from the collimating optical system at a deflection angle smaller than 90° to scan the light over the subject, a focusing optical system for focusing the light scanned by the scanning mirror onto the subject, and a pupil-projection optical system disposed between the focusing optical system and the above-described scanning mirror.


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