The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7153630 B1

PDF
Full Text
Expired
Date of Patent:
Dec. 26, 2006

Filed:

Jun. 07, 2005
Applicant:

Theodore H. Fedynyshyn, Sudbury, MA (US);

Inventor:

Theodore H. Fedynyshyn, Sudbury, MA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/004 (2006.01);
U.S. Cl.
CPC ...
Abstract

Novel photoresists containing at least about 0.2 molar ratio of a base with respect to the concentration of a photoacid generator present and their preparation are described. It has been discovered that inclusion of a sufficient amount of base counteracts the detrimental effects of photoacid generators, thus providing resists having submicron linewidth resolution.


Find Patent Forward Citations

Fedynyshyn, Theodore. (2006). Resist with reduced line edge roughness (U.S. Patent No. 7153630). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7153630

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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