The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7153362 B1

PDF
Full Text
Expired
Date of Patent:
Dec. 26, 2006

Filed:

Apr. 30, 2002
Applicants:

Chang-hyun Ko, Seoul, KR;

Jai-dong Lee, Yongin, KR;

Jin-hee Lee, Seoul, KR;

Inventors:

Chang-Hyun Ko, Seoul, KR;

Jai-Dong Lee, Yongin, KR;

Jin-Hee Lee, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C30B 23/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method for real time deposition process control based on resulting product detection, where the system and method detect an amount of at least one reaction product in real time, while the deposition process is being performed, the detected amount of reaction product is compared with a reference amount, and a comparison result is fed back in real time to adjust a supply of one or more reactants. The system and method provide real time control over the deposition process and/or reduce the number of wafers produced that do not meet processing target values.


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Ko, Chang-Hyun. (2006). System and method for real time deposition process control based on resulting product detection (U.S. Patent No. 7153362). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7153362

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