The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 26, 2006
Filed:
Oct. 09, 2003
Yuzo Otsuka, Tokyo, JP;
Yuzo Otsuka, Tokyo, JP;
Tetra Laval Holdings & Finance S.A., Pully, CH;
Abstract
An object is to provide an inspection sample making apparatus () that can simplify work for making an inspection sample () and can ensure inspection for seal condition. The inspection sample making apparatus () includes a preliminary-inspection-sample-making device () for peeling a predetermined fusion-bonded piece of a packaging container () off a wall of the packaging container () so as to make a preliminary inspection sample (); and a cutting device for cutting the preliminary inspection sample () along a predetermined cutting line so as to make an inspection sample (). Since the preliminary-inspection-sample-making device () peels a predetermined fusion-bonded piece of the packaging container () off a wall of the packaging container () to thereby make the preliminary inspection sample (), and the cutting device cuts the preliminary inspection sample () along a predetermined cutting line to thereby make the inspection sample (), an operator does not need to manually make the inspection sample (). Therefore, not only is work for making the inspection sample () simplified, but also cutting at a wrong position is avoided. As a result, a seal condition inspection apparatus () can reliably inspect seal condition.