The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 19, 2006

Filed:

Jan. 08, 2003
Applicants:

Pat Dobrowski, Burnsville, MN (US);

Sean Wilson, Eagan, MN (US);

Nghy Hong, Apple Valley, MN (US);

Eric Snyder, St. Paul, MN (US);

Inventors:

Pat Dobrowski, Burnsville, MN (US);

Sean Wilson, Eagan, MN (US);

Nghy Hong, Apple Valley, MN (US);

Eric Snyder, St. Paul, MN (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06F 12/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and a methodology creates a mapping of a set of import parameters specifying a device in a first set of import data to a set of output parameters specifying the device in a first database. Such a mapping includes receiving the set of import parameters from an import file containing the first set of import data in a plurality of import records, each import record containing a plurality of import values, each import value corresponding to an import parameter from the set of import parameters; receiving the set of output parameters from the first database; and creating the mapping of the set of import parameters to the set of output parameters. The system and methodology described in here allows users to import data about various types of devices into a device database on a systematic and efficient method. Such a system and methodology also allows a user to maintain a complete database including all devices used within a process plant.


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