The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 19, 2006
Filed:
Oct. 11, 2000
Andrew Peter Bradley, Castlecrag, AU;
Dominic Yip, Lindfield, AU;
Andrew James Dorrell, East Blaxland, AU;
Andrew Peter Bradley, Castlecrag, AU;
Dominic Yip, Lindfield, AU;
Andrew James Dorrell, East Blaxland, AU;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
Disclosed is a method and apparatus for clamping the output values of filtered image data comprising a mapping of discrete sample values are disclosed. For each discrete sample value of the mapping a maximum sample value and a minimum sample value of a plurality of input discrete samples values used to calculate the discrete sample value, is determined. The output value of the discrete sample value is clamped to the domain of the plurality of input discrete sample values utilising the maximum sample value and the minimum sample value, wherein the output value is dependent on a plurality of attributes of the plurality of input discrete sample values.