The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 19, 2006

Filed:

Nov. 16, 2001
Applicants:

Yoshinori Nakamura, Osaka, JP;

Kazuo Takatsu, Kawasaki, JP;

Inventors:

Yoshinori Nakamura, Osaka, JP;

Kazuo Takatsu, Kawasaki, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04J 3/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

Technology for detecting a frame synchronous pattern that includes a data switch section for performing data rearrangement processing of parallel data having a given frame synchronous pattern; a temporary region detection section for temporarily detecting a candidate of region data containing the frame synchronous pattern from the parallel data; a frame synchronous pattern detection section for detecting the frame synchronous pattern from the temporary region data of the temporary region detection section; and a data switch control section for controlling data rearrangement processing by the data switch section according to the detection state of the temporary region data by the temporary region detection section and to the detection state of the frame synchronous pattern by the frame synchronous pattern detection section, in order to detect precisely the frame synchronous pattern in m parallel data without enabling the detection of m ways of frame synchronous patterns in in parallel data.


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