The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 19, 2006
Filed:
Dec. 30, 2004
Applicants:
Jean-raoul Dian, Antony, FR;
Jean-marc Teluob, Cornas, FR;
Inventors:
Jean-Raoul Dian, Antony, FR;
Jean-Marc Teluob, Cornas, FR;
Assignee:
Solystic, Gentilly, FR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/28 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method of using reflection of a laser ray (LZ) for measuring the thickness (e) of a flat mail item () consists in nipping the mail item by means of an elastically deformable member () that has a first surface () in contact with one face of said mail item, and a reflective second surface () substantially parallel to said first surface, and in directing the laser ray onto said reflective second surface () for the purpose of measuring the thickness of the mail item.