The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 19, 2006

Filed:

Aug. 11, 2004
Applicant:

Larry Kirn, East Lansing, MI (US);

Inventor:

Larry Kirn, East Lansing, MI (US);

Assignee:

Jam Technologies, Inc., Boston, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03F 3/217 (2006.01);
U.S. Cl.
CPC ...
Abstract

Feedback for self-calibration of any parameter in an analog and/or digital system is described wherein a system quality factor can be represented by a voltage or current differential. The preferred embodiment is operative to alternately supply two or more optimally equivalent currents or voltages from such a system, detect amplitude and/or phase feedback of resultant output signal at the frequency of the alternation, and use feedback to modify a calibration value, voltage, or current so as to minimize or maximize the feedback, thus effecting self-calibration of the system. Such a method and attendant apparatus enables system self-calibration without need of any high-precision or high-cost components.


Find Patent Forward Citations

Kirn, Larry. (2006). Adaptive self-calibration method and apparatus (U.S. Patent No. 7151403). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7151403

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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