The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 19, 2006
Filed:
Jan. 22, 2002
Yoshihiro Hirata, Hyogo, JP;
Tsuyoshi Haga, Hyogo, JP;
Toshiyuki Numazawa, Hyogo, JP;
Kazuo Nakamae, Hyogo, JP;
Kazunori Okada, Hyogo, JP;
Jun Yorita, Hyogo, JP;
Yoshihiro Hirata, Hyogo, JP;
Tsuyoshi Haga, Hyogo, JP;
Toshiyuki Numazawa, Hyogo, JP;
Kazuo Nakamae, Hyogo, JP;
Kazunori Okada, Hyogo, JP;
Jun Yorita, Hyogo, JP;
Sumitomo Electric Industries, Ltd., Osaka, JP;
Abstract
A method of manufacturing a contact probe includes an electroforming step of, using a resist film () arranged on a substrate () as a pattern frame having a shape corresponding to a contact probe, performing electroforming to fill a gap in the resist film () to form a metal layer (), a tip end shaping step of obliquely removing and sharpening that part of the metal layer () which serves as a tip end portion of the contact probe, and a take-out step of taking out only the metal layer () from the pattern frame.