The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 19, 2006
Filed:
Oct. 03, 2005
Hyeck-jin Joung, Chungcheongnam-do, KR;
Heui-seog Kim, Chungcheongnam-do, KR;
Seok-young Yoon, Chungcheongnam-do, KR;
Jong-keun Jeon, Chungcheongnam-do, KR;
Hyeck-Jin Joung, Chungcheongnam-do, KR;
Heui-Seog Kim, Chungcheongnam-do, KR;
Seok-Young Yoon, Chungcheongnam-do, KR;
Jong-Keun Jeon, Chungcheongnam-do, KR;
Samsung Electronics Co., Ltd., Suwon-si, KR;
Abstract
The present invention relates to an insert block for testing semiconductor devices. The insert block comprises one or more pushers, installed in a block body having a loading space to accommodate a semiconductor device under test, including a first push rod to apply force to one of adjacent sides of the semiconductor device under test and a second push rod to apply force to the other thereof. Accordingly, firm centering of semiconductor devices under test relative to the contact pins of the test socket along the two perpendicular axes (for instance, x and y axes) on the top or bottom surface of the semiconductor device is achieved and leads to the proper interfaces between the external terminals of the semiconductor device under test and the contact pins of the test socket, and thereby improves the quality of connection therebetween.