The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 19, 2006
Filed:
Jun. 22, 2004
Hiroshi Kitaguchi, Tokyo, JP;
Atsushi Yamagoshi, Tokyo, JP;
Shigeru Izumi, Tokyo, JP;
Tetsuya Matsui, Tokyo, JP;
Akihisa Kaihara, Tokyo, JP;
Hiroshi Kitaguchi, Tokyo, JP;
Atsushi Yamagoshi, Tokyo, JP;
Shigeru Izumi, Tokyo, JP;
Tetsuya Matsui, Tokyo, JP;
Akihisa Kaihara, Tokyo, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
To provide a radioactive gas measurement apparatus that is simply constructed and can efficiently measure Xe-133 in a radioactive gas on-line under the condition that the radioactive gas is mixed with interference N-13, an apparatus is provided for measuring a radiation emitted from Xe-133, including an anticoincidence counter circuitthat conducts counting if it receives an output of a main detectorwhen it does not receive outputs of scintillation detectorsand, and a gate circuit, a plate-shaped semiconductor detector is used as the main detector, and a material not emitting a characteristic X ray in the range from 70 to 90 keV is used for a shielding structure. In particular, the thickness of the semiconductor detectoris set to fall within a range from 2 mm to 7 mm, thereby improving the analysis precision.