The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7151016 B1

PDF
Full Text
Expired
Date of Patent:
Dec. 19, 2006

Filed:

Jul. 12, 2002
Applicants:

Masayuki Kajiwara, Kanagawa-ken, JP;

Ritsuko Nagao, Kanagawa-ken, JP;

Inventors:

Masayuki Kajiwara, Kanagawa-ken, JP;

Ritsuko Nagao, Kanagawa-ken, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for manufacturing a semiconductor device having a circuit made up by a TFT (Thin Film Transistor) having GOLD (Gate-Drain Overlapped LDD) structure, which an LDD region overlaps which a portion of a gate electrode, wherein the formation of a concentration depth profile peak of hydrogen in a semiconductor film is avoided to thereby improve the electrical characteristics of the TFT. The use of the semiconductor film manufactured in this manner allows manufacturing of a semiconductor device with good electrical characteristics only by hydrogenating treatment even when the activation of impurity elements does not carried out.


Find Patent Forward Citations

Kajiwara, Masayuki. (2006). Method of manufacturing a semiconductor device that includes a hydrogen concentration depth profile (U.S. Patent No. 7151016). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7151016

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