The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 19, 2006
Filed:
Dec. 08, 2004
Applicants:
Yasukazu Ono, Kasugai, JP;
Motoharu Yakura, Kasugai, JP;
Inventors:
Yasukazu Ono, Kasugai, JP;
Motoharu Yakura, Kasugai, JP;
Assignee:
Fujitsu Limited, Kawasaki, JP;
Primary Examiner:
Int. Cl.
CPC ...
H01B 13/20 (2006.01);
U.S. Cl.
CPC ...
Abstract
A probe needle having a coaxial structure that facilitates assembly of a probe card. The probe needle is manufactured by covering a central conductive body with an insulative tube, and forming a conductive layer around the insulative tube by superimposing a film of fine conductive grains around the insulative tube.
Ono, Yasukazu. (2006). Method for manufacturing probe needle, method for manufacturing probe card, and probe card (U.S. Patent No. 7150095). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7150095
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile